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Evaluation of the quality of images obtained using amorphous silicon flat-panel digital detectors in CyberKnife VSI system(PDF)

《中国医学物理学杂志》[ISSN:1005-202X/CN:44-1351/R]

Issue:
2021年第2期
Page:
133-137
Research Field:
医学放射物理
Publishing date:

Info

Title:
Evaluation of the quality of images obtained using amorphous silicon flat-panel digital detectors in CyberKnife VSI system
Author(s):
ZHU Xiaohui1 LIANG Zhiwen1 DU Jinlin2 LI Xiaodong2 LONG Hao2 YANG Jing1
1. Cancer Center, Union Hospital, Tongji Medical College, Huazhong University of Science and Technology, Wuhan 430022, China 2. School of Electronic and Information Engineering, South-Central University for Nationalities, Wuhan 430074, China
Keywords:
Keywords: amorphous silicon flat-panel digital detector CyberKnife VSI QCkV-1 phantom spatial resolution contrast-to-noise ratio
PACS:
R318;R815
DOI:
DOI:10.3969/j.issn.1005-202X.2021.02.001
Abstract:
Abstract: Objective To evaluate and analyze the imaging quality of the amorphous silicon flat-panel digital detectors in CyberKnife VSI system using QCkV-1 phantom and PIPSpro software. Methods QCkV-1 phantom and the special positioning frame were repeatedly placed in the image center of CyberKnife imaging subsystem according to the pre-designed plans. After X-ray tube photography, two groups of images recorded by the amorphous silicon flat-panel digital detectors (cameras A and B) were acquired and imported into PIPSpro software for analysis. The analysis indicators included spatial resolution (f30, f40 and f50) and contrast-to-noise ratio. Results Within the range of kV values for clinical treatment (100-125 kV), the maximum deviations of f30, f40 and f50 for camera A were 0.94%, 1.67%, 0.29%, while those were 0.81%, 1.31% and 1.42% for camera B, respectively. The contrast-to-noise ratios of images obtained by two cameras changed gently with kV when the value was less than 115 kV and showed obvious differentiations when it was greater than 115 kV. Conclusion QCkV-1 phantom combined with PIPSpro software can be used to easily detect and analyze the imaging quality of the amorphous silicon flat-panel digital detectors in CyberKnife VSI system.

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Last Update: 2021-02-02